The National Institute of Advanced Industrial Science and Technology (AIST) has identified the origin of noise in transistors that operate at extremely low temperatures and are used to control qubit devices.
In this research, the noise generation phenomenon was statistically evaluated for a large number of transistors, and it was identified that at extremely low temperatures, minute disturbances in atomic positions that accompany atomic-sized defects generate noise. As a result, in the future, research that will lead to higher performance of control integrated circuits by noise reduction, and eventually to higher performance of quantum computers, will be accelerated.